Takatsuki, Japan

Yohei Oka

This inventor holds 1 USPTO granted patent. Top assignee: Rigaku Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yohei Oka. Retrieved from https://idiyas.com/inventor/yohei-oka-nnxx63uh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Yohei Oka

Introduction

Yohei Oka is a notable inventor based in Takatsuki, Japan. He has made significant contributions to the field of sample analysis, particularly in the development of a specialized sample holder. His work is characterized by a focus on enhancing the efficiency and effectiveness of X-ray fluorescence analysis.

Latest Patents

Oka holds a patent for a sample holder designed to facilitate the replacement of samples while minimizing the deterioration of the resin member due to X-rays. This innovative sample holder includes a cylindrical member, a saucer, an elastic member, a resin member with a bow part, and a bottom plate. The construction of the holder ensures that the resin member is protected from exposure, thereby maintaining its integrity during analysis.

Career Highlights

Yohei Oka is associated with Rigaku Corporation, a company renowned for its advancements in analytical and measurement technologies. His work at Rigaku has allowed him to contribute to the development of tools that are essential for scientific research and industrial applications.

Collaborations

Oka has collaborated with esteemed colleagues such as Koichi Aoyagi and Yasujiro Yamada. These partnerships have fostered an environment of innovation and have led to the successful development of new technologies in the field.

Conclusion

In summary, Yohei Oka's contributions to the field of sample analysis through his innovative sample holder patent exemplify his commitment to advancing technology. His work continues to impact the scientific community positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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