Cleveland Heights, OH, United States of America

Yoh Han Pao

This inventor holds 1 USPTO granted patent. Top assignee: Ai Ware, Inc.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoh Han Pao. Retrieved from https://idiyas.com/inventor/yoh-han-pao-ui92rfwo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Yoh Han Pao

Introduction

Yoh Han Pao is a notable inventor based in Cleveland Heights, OH (US). He has made significant contributions to the field of data processing and pattern recognition. His innovative approach to self-organization of pattern data has garnered attention in the technological community.

Latest Patents

Yoh Han Pao holds a patent for a system that provides a self-organized reduced-dimension remapping of pattern data. This system functions to map from an original pattern space to a reduced-dimension space in an unsupervised nonlinear manner, while conserving the overall variance in the representation of the data. His approach is distinct from both the Karhunen-Loeve (K-L) transform and auto-associative methods, as well as from the Advanced Reasoning Tool (ART) and feature mapping techniques. The system is designed to be highly efficient computationally, allowing for further simplification of the reduced-dimension representation using ART or feature mapping techniques as needed.

Career Highlights

Yoh Han Pao is currently associated with Ai Ware, Inc., where he continues to develop and refine his innovative ideas. His work focuses on enhancing the efficiency and effectiveness of data representation and processing.

Collaborations

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Conclusion

Yoh Han Pao's contributions to the field of data processing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the way pattern data is understood and utilized.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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