This inventor holds 1 USPTO granted patent. Top assignees: Opticon, Inc., Optoelectronics Co., Ltd.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: The Innovative Contributions of Yo Tanaka
Introduction
Yo Tanaka is a notable inventor based in Warabi, Japan. He has made significant contributions to the field of optical code scanning technology. His innovative approach has led to the development of a unique method that enhances the functionality of optical code scanners.
Latest Patents
Tanaka holds a patent for a "Method and apparatus for scanning optical code." This invention intentionally introduces optical aberration into the optical system that produces the scanning beam of an optical code scanner. By doing so, it creates a scanning beam with multiple focal points or waists at varying distances from the scanner. This advancement allows for an increased operating range of the scanner, effectively utilizing different beam waist locations when the optical code is at different distances. The invention also involves the introduction of coma into the optical system, which further enhances the scanning capabilities.
Career Highlights
Throughout his career, Tanaka has worked with several companies, including Optoelectronics Co., Ltd. and Opticon, Inc. His experience in these organizations has contributed to his expertise in optical technologies and innovations.
Collaborations
Tanaka has collaborated with notable individuals in the field, including Zhihui Duan and Masayoshi Yamanouchi. These collaborations have likely enriched his work and expanded the impact of his inventions.
Conclusion
Yo Tanaka's contributions to optical code scanning technology exemplify the spirit of innovation. His patent and career achievements highlight the importance of advancements in this field. His work continues to influence the development of more efficient scanning technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile