The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2013
Filed:
Dec. 10, 2008
Zhihui Duan, Warabi, JP;
Masayoshi Yamanouchi, Warabi, JP;
Kazunori Noborio, Warabi, JP;
Yo Tanaka, Warabi, JP;
Hiroshi Hayakawa, Warabi, JP;
Zhihui Duan, Warabi, JP;
Masayoshi Yamanouchi, Warabi, JP;
Kazunori Noborio, Warabi, JP;
Yo Tanaka, Warabi, JP;
Hiroshi Hayakawa, Warabi, JP;
Optoelectronics Co., Ltd., , JP;
Opticon, Inc., Renton, WA (US);
Abstract
An optical aberration is intentionally introduced into the optical system which produces the scanning beam of an optical code scanner, in order to produce a scanning beam which has plural focal points or waists at different distances from the scanner. The operating range of the scanner can thereby be increased by taking advantage of different beam waist locations when the optical code is at different distances from the scanner. In accordance with an embodiment of the invention, coma is intentionally introduced to an optical system providing a light beam for an optical code scanner. This provides a scanning beam with plural beam waists at different distances from the scanner. This may be accomplished by orienting the light source and focusing optical system so that their optical axes intersect or by introducing an optical member, such as a prism, between the original light source and the focusing optical system.