Yisha Cao

Title: Yisha Cao: Innovator in Optical Measurement Technologies

Introduction

Yisha Cao is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of optical measurement technologies. With a focus on improving the accuracy and efficiency of optical systems, Yisha has developed innovative solutions that address critical challenges in the industry.

Latest Patents

Yisha Cao holds 2 patents that showcase his expertise in optical technologies. His latest patents include:

1. **Apparatus and method for detecting wavefront aberration of objective lens**: This invention involves a wavefront detection system, a planar mirror, and a planar mirror adjusting mechanism. The objective lens is strategically placed between the planar mirror and the wavefront detection system. The system detects wavefront aberration by analyzing the test wavefront emitted by the detection system, which passes through the objective lens and is reflected back by the planar mirror.

2. **Multi-channel device and method for measuring distortion and magnification of objective lens**: This multi-channel device comprises an illumination system, a reticle stage, a test reticle, a projection objective lens, a wafer stage, and a multi-channel image plane sensor. It simultaneously measures image placement shifts and calculates distortion and magnification errors, thereby enhancing measurement accuracy and reducing time.

Career Highlights

Yisha Cao is affiliated with the Chinese Academy of Sciences, where he conducts research and development in optical technologies. His work has significantly advanced the understanding and application of optical measurement systems.

Collaborations

Yisha collaborates with notable colleagues, including Feng Tang and Xiangzhao Wang. Their combined expertise fosters innovation and drives progress in their research endeavors.

Conclusion

Yisha Cao is a distinguished inventor whose work in optical measurement technologies has made a lasting impact. His innovative patents reflect his commitment to advancing the field and improving measurement accuracy in optical systems.