Yiqiang Ni

Title: Yiqiang Ni: Innovator in Fault Isolation Technology

Introduction

Yiqiang Ni is a prominent inventor based in Guangzhou, China. He has made significant contributions to the field of fault isolation technology, showcasing his expertise through innovative patents. His work is particularly relevant in the realm of electronics and testing.

Latest Patents

Yiqiang Ni holds a patent titled "Method and apparatus for fault isolation, computer device, medium and program product." This patent describes a method for fault isolation that involves acquiring a thermal imaging picture of a surface of a to-be-tested chip. The thermal imaging picture is obtained by scanning the chip with a test signal applied through an infrared thermal imaging device. The method further includes analyzing the thermal imaging picture to determine the phase angle of each point on the chip's surface. Additionally, a three-dimensional image of the chip is acquired and analyzed to obtain the three-dimensional coordinates of each point. Ultimately, the method calculates the three-dimensional coordinates of any faults present in the chip.

Career Highlights

Yiqiang Ni is affiliated with the China Electronics Reliability and Environmental Testing Institute. His role at this institute allows him to apply his innovative ideas and contribute to advancements in electronic testing and reliability.

Collaborations

Yiqiang Ni has collaborated with notable colleagues such as Shizheng Yang and Liang He. Their combined expertise enhances the research and development efforts within their field.

Conclusion

Yiqiang Ni's contributions to fault isolation technology exemplify his innovative spirit and dedication to advancing electronic testing methods. His patent reflects a significant step forward in ensuring the reliability of electronic devices.