Yinze Wang

Title: Innovations of Yinze Wang in Composite Material Defect Identification

Introduction

Yinze Wang is an accomplished inventor based in Chengdu, China. He has made significant contributions to the field of composite materials, particularly in the identification of defects using advanced imaging techniques. His innovative approach has the potential to enhance the quality control processes in various industries.

Latest Patents

Yinze Wang holds a patent for a method titled "Method for quantitatively identifying the defects of large-size composite material based on infrared image sequence." This invention provides a systematic approach to identifying defects in large composite materials by utilizing infrared imaging. The method involves obtaining the overlap area of an infrared splicing image and dividing it into three distinct parts: overlap area, reference image area, and registration image area. By extracting defect areas and analyzing thermal response curves, the method allows for accurate identification of defect sizes.

Career Highlights

Yinze Wang is affiliated with the University of Electronic Science and Technology of China, where he continues to advance research in composite materials. His work not only contributes to academic knowledge but also has practical applications in industries that rely on composite materials for their products.

Collaborations

Yinze Wang has collaborated with notable colleagues, including Yuhua Cheng and Chun Yin. Their combined expertise enhances the research and development efforts in their respective fields.

Conclusion

Yinze Wang's innovative methods for identifying defects in composite materials represent a significant advancement in the field. His contributions are poised to impact quality control processes across various industries, showcasing the importance of innovation in material science.