Hangzhou, China

Yinjie Chen

This inventor holds 1 USPTO granted patent. Top assignee: China Jiliang University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yinjie Chen. Retrieved from https://idiyas.com/inventor/yinjie-chen-ywebzqqx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yinjie Chen and Ultrasound Echo Measurement

Introduction

Yinjie Chen is an inventor associated with China Jiliang University in Hangzhou, China. His work includes a patent focused on measuring the time-of-flight of ultrasound echo signals, a problem in measurement technology.

Latest Patents

Chen’s listed patent, “Methods for Measuring Times-of-Flight of Ultrasound Echo Signals,” describes a method for estimating the travel time of an ultrasound echo. It captures an echo signal, denoises and reconstructs it using an empirical wavelet transform, and identifies characteristic points with preset algorithms. The method then measures the signal’s time-of-flight from those points. Its stated aim is to improve measurement accuracy through relatively simple calculations. Chen is associated with 1 patent.

Career Highlights

The available information connects Chen’s inventive work with China Jiliang University. His patent applies signal processing and characteristic-peak positioning to ultrasound measurement.

Collaborations

Weiguo Zhao and Keshu Qian are identified as Chen’s coworkers. The provided information does not specify their roles in the patent or describe particular collaborative projects.

Conclusion

Yinjie Chen’s listed patent addresses ultrasound echo timing by combining signal reconstruction with characteristic-point analysis, reflecting an application of signal processing to measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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