The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Jan. 18, 2025
China Jiliang University, Hangzhou, CN;
Yinjie Chen, Hangzhou, CN;
Weiguo Zhao, Hangzhou, CN;
Keshu Qian, Hangzhou, CN;
Hongli Pan, Hangzhou, CN;
Cheng Xu, Hangzhou, CN;
CHINA JILIANG UNIVERSITY, Hangzhou, CN;
Abstract
Disclosed is a method for measuring time-of-flight of an ultrasound echo signal, and relate to the field of measurement technology. The method comprising: capturing an echo signal; obtaining a reconstructed echo signal by performing denoising and reconstruction on the echo signal using an empirical wavelet transform; obtaining a preset reference echo peak value and a reconstructed echo peak value, and determining an echo characteristic peak of the reconstructed echo signal using a preset characteristic peak positioning algorithm; obtaining echo characteristic point of the echo signal; and measuring the time-of-flight of the echo signal based on the echo characteristic point using a preset measurement algorithm. Using the provided method, the time-of-flight of the ultrasound echo signal can be obtained more accurately through simple calculations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile