Beijing, China

Yingming Wu


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):

Title: Yingming Wu: Innovator in Metal Film Measurement Technology

Introduction

Yingming Wu is a prominent inventor based in Beijing, China. He has made significant contributions to the field of technology, particularly in the measurement of metal films. His innovative approach has led to the development of a unique method that enhances the precision of metal film thickness determination.

Latest Patents

Yingming Wu holds a patent for a "Method for determining thickness of metal film of wafer, polishing device, and medium." This patent describes a method that includes determining a reference thickness of the metal film based on measurement signals. These signals indicate the measured thicknesses at different positions on the metal film. The method also involves determining sub-adjustment parameters based on an adjustment parameter included in the reference thickness. This adjustment parameter includes sub-adjustment parameters corresponding to the topographies of different edges of the metal film. Furthermore, the method adjusts a coordinate value of a sampling point in a to-be-processed area of the metal film, processes the amplitude of the signal corresponding to the sampling point, and ultimately determines the thickness of the metal film based on the processed signal amplitude. Yingming Wu has 1 patent to his name.

Career Highlights

Yingming Wu is currently employed at Hwatsing (Beijing) Technology Co., Ltd. His work at this company focuses on advancing technologies related to metal film measurement and polishing devices. His innovative contributions have positioned him as a key figure in his field.

Collaborations

Yingming Wu collaborates with talented individuals such as Xinchun Lu and Fangxin Tian. Their combined expertise fosters an environment of innovation and progress within their projects.

Conclusion

Yingming Wu's contributions to the field of metal film measurement technology exemplify the spirit of innovation. His patented method showcases his dedication to enhancing precision in technological applications. His work continues to influence advancements in the industry.

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