This inventor holds 1 USPTO granted patent. Top assignees: Chinese Academy of Sciences, Shanghai Hengyi Optics and Fine Mechanics Co., Ltd. Active years: 2024.
Company Filing History:
1 out of 3,334 
1 out of 1 Years Active: 2024
Title: Yingjia Li: Innovator in Photothermal Measurement Technology
Introduction
Yingjia Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of photothermal measurement technology. His innovative work has led to the development of a unique apparatus that enhances measurement sensitivity and stability.
Latest Patents
Yingjia Li holds a patent for a "Single-beam photothermal measurement apparatus and measurement method for absorptive defects." This invention features a common-path-type structure and a non-common-path-type structure. The design is characterized by its simple optical structure, which facilitates easy alignment and adjustment. The measurement results obtained from this apparatus are stable, effectively avoiding anomalies caused by environmental vibrations and sample tilts. By detecting power changes at the edge of a beam spot, the measurement sensitivity of the system is significantly improved. He has 1 patent to his name.
Career Highlights
Throughout his career, Yingjia Li has worked with esteemed organizations such as the Chinese Academy of Sciences and Shanghai Hengyi Optics and Fine Mechanics Co., Ltd. His experience in these institutions has allowed him to refine his skills and contribute to advancements in optical measurement technologies.
Collaborations
Yingjia Li has collaborated with notable colleagues, including Jianda Shao and Shijie Liu. Their joint efforts have furthered research and development in their respective fields.
Conclusion
Yingjia Li's innovative contributions to photothermal measurement technology exemplify his dedication to advancing scientific understanding. His work continues to influence the field and inspire future innovations.