Yingfei Wang

Title: Yingfei Wang: Innovator in Microscopy Characterization

Introduction

Yingfei Wang is a notable inventor based in Wuhan, China. He has made significant contributions to the field of microscopy through his innovative methods. His work focuses on enhancing the characterization of structures, which is crucial for various applications in technology and research.

Latest Patents

Yingfei Wang holds a patent titled "Method for tilting characterization by microscopy." This patent describes a method that includes measuring a first tilting shift of structures based on their initial arrangement. The structures are oriented vertically on a horizontal plane of a product. The method further involves measuring a second tilting shift based on a horizontal flip of the first arrangement. A corrected tilting shift is then determined using both measurements, which enhances the accuracy of characterization.

Career Highlights

Wang is currently employed at Yangtze Memory Technologies Co., Ltd., where he applies his expertise in microscopy and characterization. His work at this company has positioned him as a key player in advancing technological innovations in memory technologies.

Collaborations

Yingfei Wang collaborates with talented coworkers, including Jun Liu and Yu Li. Their combined efforts contribute to the development of cutting-edge technologies in their field.

Conclusion

Yingfei Wang's contributions to microscopy characterization through his patented methods demonstrate his innovative spirit and dedication to advancing technology. His work continues to impact the field positively.