Beijing, China

Ying Yin

USPTO Granted Patents = 4 

Average Co-Inventor Count = 2.4

ph-index = 1


Company Filing History:


Years Active: 2020-2025

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4 patents (USPTO):Explore Patents

Title: Ying Yin - Innovator in Abnormal Data Processing Systems

Introduction

Ying Yin is a prominent inventor based in Beijing, China. He has made significant contributions to the field of data processing, particularly in developing systems that identify abnormal data. With a total of 4 patents to his name, Ying Yin is recognized for his innovative approaches to data management.

Latest Patents

One of Ying Yin's latest patents is the "Abnormal Data Processing System and Abnormal Data Processing Method." This system is designed to enhance the accuracy of data analysis by utilizing a storage unit that holds both multiple-subject and individual-subject databases. The system includes an individual-subject database divergence-degree calculation unit, which assesses how new data diverges from existing individual data. Additionally, it features a multiple-subject database divergence degree calculation unit that evaluates the divergence of new data from a broader dataset. The composite divergence degree calculation unit then combines these assessments to determine whether the new data is abnormal based on the calculated composite divergence degree.

Career Highlights

Ying Yin is currently employed at Maxell, Ltd., where he continues to innovate in the field of data processing. His work has been instrumental in advancing technologies that improve data accuracy and reliability.

Collaborations

Ying Yin collaborates with talented individuals such as Yuko Sano and Akihiko Kandori, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Ying Yin's contributions to the field of data processing, particularly through his patents, highlight his role as a leading inventor. His work at Maxell, Ltd. and collaborations with other professionals further emphasize his commitment to advancing technology in this critical area.

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