The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Jan. 11, 2023
Maxell, Ltd., Kyoto, JP;
Yuko Sano, Tokyo, JP;
Akihiko Kandori, Tokyo, JP;
Tomohiko Mizuguchi, Oyamazaki, JP;
Ying Yin, Beijing, CN;
MAXELL, LTD., Kyoto, JP;
Abstract
The abnormal data processing system is provided with: a storage unit for holding a multiple-subject DB in which data on multiple subjects are accumulated and individual-subject DB in which data on individual subjects are accumulated; an individual-subject DB divergence-degree calculation unit for calculating an individual-subject DB divergence degree which is the degree of divergence of the new data from the individual-subject DB; a multiple-subject DB divergence degree calculation unit for calculating a multiple-subject DB divergence degree which is the degree of divergence of the new data from the multiple-subject DB; and a composite divergence degree calculation unit for determining a composite divergence by compositing the individual-subject DB divergence degree and the multiple-subject DB divergence degree using the number of data instances in the individual-subject DB. The abnormal data processing system determines whether or not the new data is abnormal on the basis of the composite divergence degree.