Ying-Lin Pan

Title: Innovator Ying-Lin Pan: Pioneering Solutions in Board Warping Measurement

Introduction: Ying-Lin Pan, an esteemed inventor based in New Taipei, Taiwan, has made significant strides in the field of measurement technology. With one notable patent to his name, he has demonstrated his expertise and commitment to innovation in engineering applications.

Latest Patents: Ying-Lin Pan holds a patent for a "Board-warping measuring apparatus and board-warping measuring method thereof." This innovative method is designed for measuring devices under test by incorporating a sophisticated approach that enhances accuracy and efficiency. The process includes projecting a pattern with multiple reference points onto the device, capturing measurement images, and calculating position heights to compensate for any warping. This method embodies a critical advancement in ensuring the precision of engineering measurements.

Career Highlights: Currently, Ying-Lin Pan is affiliated with Test Research, Inc., where he applies his knowledge and skills in developing measurement solutions. His dedication to his work and innovative thinking has earned him recognition within the industry. By continually pushing the boundaries of what is possible in measurement technology, he has contributed to advancements that benefit various applications.

Collaborations: Ying-Lin Pan collaborates closely with his colleagues, including Liang-Pin Yu and Chi-Yang Lin. Together, they harness their collective expertise to drive innovation at Test Research, Inc., further enhancing the company's position in the measurement technology sector.

Conclusion: Ying-Lin Pan is a remarkable figure in the realm of measurement innovation. His patent for a board-warping measuring method exemplifies his dedication to advancing technology and improving measurement accuracy. With ongoing collaborations and a strong focus on innovation, Pan continues to influence the field, paving the way for future developments in measurement technology.