Tainan, Taiwan

Ying-Han Yeh

This inventor holds 4 USPTO granted patents. Top assignee: Himax Technologies, Inc.. Active years: 2020-2021.


% Patents Active = 100.0

Average Co-Inventor Count = 1.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020-2021

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4 patents (USPTO):Explore Patents

Title: Innovations of Ying-Han Yeh

Introduction

Ying-Han Yeh is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of technology, particularly in the areas of image processing and display technology. With a total of 4 patents to his name, his work continues to influence advancements in various applications.

Latest Patents

Ying-Han Yeh's latest patents include a method for detecting the dimensions of a box based on a depth map. This innovative method involves receiving a depth map generated by a camera, performing coordinate transformations, and statistically analyzing pixel data to classify blocks and extract dimensions. Another significant patent is a mura compensation method and apparatus for OLED displays. This apparatus includes a calculator that determines demura offset values for pixels based on gray levels, enhancing the display quality of organic light-emitting diode screens.

Career Highlights

Ying-Han Yeh is currently employed at Himax Technologies, Inc., where he applies his expertise in developing cutting-edge technologies. His work has been instrumental in improving display technologies and image processing methods, showcasing his commitment to innovation.

Collaborations

Ying-Han Yeh has collaborated with talented individuals such as Bo-Ruei Lin and Yun-Sheng Lin. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Ying-Han Yeh's contributions to technology through his patents and collaborations highlight his role as an influential inventor. His work continues to pave the way for advancements in image processing and display technologies.

Profile summary based on public USPTO records.
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