This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: China University of Geosciences (Wuhan), Wuhan Wuda Zoyon Science and Technology Co., Ltd. Active years: 2020-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 50 
1 out of 3 Years Active: 2020-2026
Title: Innovations by Ying Chen in Surface Deformation Analysis
Introduction
Ying Chen is a notable inventor based in Wuhan, China. He has made significant contributions to the field of surface deformation analysis through his innovative methods and technologies. His work focuses on enhancing the accuracy and efficiency of extracting deformation features from three-dimensional point cloud data.
Latest Patents
Ying Chen holds a patent titled "Methods for extracting surface deformation feature of object based on linear scanning three-dimensional point cloud." This patent describes a comprehensive method for extracting surface deformation features of an object using a three-dimensional measurement sensor based on line structured light. The process involves data acquisition, data pre-processing, and the elimination of abnormal data influences. It also includes obtaining binary images based on deformation feature points and performing morphological operations to ensure complete detection of deformation regions. The method ultimately allows for accurate statistical analysis of deformation characteristics.
Career Highlights
Ying Chen is associated with Wuhan Wuda Zoyon Science and Technology Co., Ltd. His work at this company has been pivotal in advancing technologies related to three-dimensional measurements and surface analysis. His innovative approach has led to the development of methods that significantly improve the accuracy of deformation detection.
Collaborations
Ying Chen has collaborated with notable colleagues, including Qingquan Li and Dejin Zhang. Their combined expertise has contributed to the successful development and implementation of advanced technologies in their field.
Conclusion
Ying Chen's contributions to the field of surface deformation analysis through his innovative patent demonstrate his commitment to advancing technology. His work not only enhances the understanding of deformation characteristics but also sets a foundation for future innovations in three-dimensional measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile