The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 2020
Filed:
Jan. 15, 2016
Wuhan Wuda Zoyon Science and Technology Co., Ltd., Wuhan, CN;
Qingquan Li, Wuhan, CN;
Min Cao, Wuhan, CN;
Dejin Zhang, Wuhan, CN;
Hong Lin, Wuhan, CN;
Ying Chen, Wuhan, CN;
WUHAN WUDA ZOYON SCIENCE AND TECHNOLOGY CO., LTD, Wuhan, CN;
Abstract
A method for extracting a surface deformation feature of an object based on linear scanning three-dimensional point cloud is disclosed comprising: performing data acquisition by using a three-dimensional measurement sensor based on line structured light, and obtaining a three-dimensional point cloud data of a surface of the object after data pre-processing; eliminating influences of abnormal data and textures on extraction of sectional main profiles, to accurately obtain the sectional main profiles of the object; obtaining a binary image based on deformation feature points extracted from sections, in conjunction with a deformation feature knowledge base, and preliminarily positioning a deformation region based on sub-block images to obtain a set of target morphology sub-blocks; then performing a morphological operation on deformation feature points in the set of target morphology sub-blocks, and generating a deformation region of confidence ROC, and then performing a region growth to extract a target using geometrical features of the ROC so as to guarantee completeness of detection of deformation regions; and finally, making statistics on deformation characteristic values of a deformation region in the surface of the object according to predefined deformation features, so as to accurately obtain complete attribute information about deformation of the object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile