Yin-Chao Hwang

Title: Innovations by Yin-Chao Hwang

Introduction

Yin-Chao Hwang is a notable inventor based in Sugar Land, Texas. She has made significant contributions to the field of logic device testing, holding a total of four patents. Her work focuses on enhancing the efficiency and effectiveness of test circuits and logic devices.

Latest Patents

One of her latest patents is titled "Test circuit and scan tested logic device with isolated data lines." This invention involves a test circuit designed for a logic device that includes a serial scan path for transferring externally generated test vectors. The circuit features a storing circuit that retains a data bit, with various interface circuits facilitating synchronous and asynchronous data transfers during testing. Another significant patent is the "Parallel/serial scan system for testing logic circuits." This invention incorporates parallel registers that interface with a common internal bus, allowing for the storage and application of test vectors to associated logic circuits. The design improves the speed of data scanning into the device, enhancing overall testing efficiency.

Career Highlights

Yin-Chao Hwang is currently employed at Texas Instruments Corporation, where she continues to innovate in the field of logic device testing. Her work has been instrumental in advancing testing methodologies and improving the reliability of logic circuits.

Collaborations

Throughout her career, Yin-Chao has collaborated with notable colleagues, including Theo J. Powell and Jeffrey D. Bellay. These collaborations have contributed to the development of her innovative patents and advancements in technology.

Conclusion

Yin-Chao Hwang's contributions to the field of logic device testing through her patents demonstrate her expertise and commitment to innovation. Her work continues to influence the industry and improve testing processes for logic circuits.