Yiling Lou

Title: Yiling Lou: Innovator in Defect Location Technology

Introduction

Yiling Lou is a prominent inventor based in Beijing, China. She has made significant contributions to the field of software engineering, particularly in defect location methods. Her innovative approach leverages advanced techniques to enhance the accuracy of identifying defects in software programs.

Latest Patents

Yiling Lou holds a patent for a "Defect location method and device based on coverage information." This patent describes a method that characterizes program structure information and test case coverage information of a target program in a graph format. The process involves generating a node attribute sequence and an adjacency matrix based on the graph-characterized structure. By inputting these elements into a trained graph neural network model, the model outputs a suspicious degree list of the target program. This method improves the accuracy of defect location by preserving coverage information without loss and considering structural information.

Career Highlights

Yiling Lou is affiliated with Peking University, where she continues to advance her research and development in software engineering. Her work has garnered attention for its innovative approach to defect detection, making her a valuable asset in her field.

Collaborations

Yiling Lou collaborates with notable colleagues, including Lu Zhang and Qihao Zhu. Their combined expertise contributes to the advancement of technology in defect location methods.

Conclusion

Yiling Lou's contributions to the field of software engineering through her innovative patent demonstrate her commitment to improving defect location accuracy. Her work at Peking University and collaborations with esteemed colleagues further highlight her impact in the industry.