Peking University

Yiling Lou

Lu Zhang

Jinhao Dong

Dan Hao

Qihao Zhu

Zeyu Sun

The present disclosure discloses a defect location method and device based on coverage information, the method including: characterizing program structure information and test case coverage information of a target program in a graph to obtain a graph-characterized structure; generating a node attribute sequence and an adjacency matrix based on the graph-characterized structure; and inputting the node attribute sequence and the adjacency matrix to a trained graph neural network model, so that the graph neural network model outputs a suspicious degree list of the target program based on the node attribute sequence and the adjacency matrix. Through the graph-based unified information characterization, the coverage information can be saved without loss and compression, and the structure information may also be considered, thereby improving the accuracy of defect location.

Growing community of inventors

Beijing, China

Yiling Lou