Zhejiang, China

Yike Zeng

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yike Zeng. Retrieved from https://idiyas.com/inventor/yike-zeng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yike Zeng: Innovator in Ultrasonic Measurement Technology

Introduction

Yike Zeng is a prominent inventor based in Zhejiang, China. He is known for his contributions to the field of ultrasonic measurement technology. His innovative work has led to the development of advanced measuring instruments that enhance precision and efficiency.

Latest Patents

Yike Zeng holds a patent for a self-adaptive all-fiber laser ultrasonic measuring instrument. This invention involves a sophisticated method where the output light of a narrow-linewidth semiconductor fiber laser is split to generate detection and reference light. The system utilizes a wavelength division multiplexer and a biaxial scanning galvanometer to create ultrasonic vibrations in the sample under test. The scattered light modulated by these vibrations is collected as signal light, which is then processed to achieve accurate ultrasonic measurements.

Career Highlights

Zeng is affiliated with Zhejiang University, where he continues to advance research in ultrasonic measurement technologies. His work has significantly impacted the field, providing new methodologies for precise measurements.

Collaborations

Yike Zeng collaborates with notable colleagues, including Jian Chen and Zhenyang Yu. Their combined expertise fosters innovation and enhances the research output at Zhejiang University.

Conclusion

Yike Zeng's contributions to ultrasonic measurement technology exemplify the spirit of innovation. His patented inventions and collaborative efforts continue to push the boundaries of what is possible in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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