The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2025
Filed:
Oct. 18, 2024
Zhejiang University, Zhejiang, CN;
Jian Chen, Zhejiang, CN;
Zhenyang Yu, Zhejiang, CN;
Yike Zeng, Zhejiang, CN;
Bingfeng Ju, Zhejiang, CN;
ZHEJIANG UNIVERSITY, Zhejiang, CN;
Abstract
Disclosed are a self-adaptive all-fiber laser ultrasonic measuring instrument and a measuring method thereof. The output light of a narrow-linewidth semiconductor fiber laser is split by a polarization controller and a polarization beam splitter to generate detection light and reference light. The detection light and visible light output by an indication laser are irradiated, through a wavelength division multiplexer and a biaxial scanning galvanometer, to a sample under test to generate ultrasonic vibration. The scattered light modulated by the ultrasonic vibration is converged and collected as signal light. The signal light and the reference light are respectively input into an interferometer from two ends of the interferometer in opposite propagation directions. The reference light demodulated by the interferometer generates a feedback control signal for adjusting the measurement performance of the interferometer. The signal light demodulated by the interferometer generates an ultrasonic signal to achieve ultrasonic measurement of the sample.