Xiamen, China

Yihang Liang

This inventor holds 1 USPTO granted patent. Top assignee: Xiamen San'an Integrated Circuit Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yihang Liang. Retrieved from https://idiyas.com/inventor/yihang-liang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yihang Liang and Nitride Semiconductor Innovation.

Introduction

Yihang Liang is an inventor associated with Xiamen, China, and Xiamen San'an Integrated Circuit Co., Ltd. His patent work includes a nitride semiconductor device designed to improve radio-frequency performance.

Latest Patents

Liang is credited with 1 patent: “Nitride Semiconductor Device.” The invention features source, drain, and gate electrodes, along with a dielectric layer and a stepped source field plate. Its two stepped portions are separated from the nitride epitaxial layer by different dielectric thicknesses, while a groove is formed in the dielectric between the field plate and the drain electrode. The design combines the stepped field plate and groove to reduce parasitic capacitances Cgd and Cds, improve RF gain, and broaden the device’s application bandwidth.

Career Highlights

Liang’s listed patent reflects work on semiconductor device structures and their electrical performance. He is associated with Xiamen San'an Integrated Circuit Co., Ltd.

Collaborations

The provided information names Shenghou Liu and Guanying Huang as Liang’s coworkers. It does not specify their roles in the patent or whether they collaborated with him on this invention.

Conclusion

Yihang Liang’s patent describes a nitride semiconductor device that uses a stepped source field plate and dielectric groove to reduce parasitic capacitance and support improved RF performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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