Dalian, China

Yifei Yu

This inventor holds 1 USPTO granted patent. Top assignee: University of California. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yifei Yu. Retrieved from https://idiyas.com/inventor/yifei-yu-3vyw5m3o

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Yifei Yu: Innovator in Fiber Optics Measurement

Introduction

Yifei Yu is a prominent inventor based in Dalian, China. He has made significant contributions to the field of fiber optics, particularly in the area of dynamic strain measurement. His innovative work has led to the development of a patented system that utilizes advanced optical techniques.

Latest Patents

Yifei Yu holds a patent for a system and method for distributed dynamic strain measurement using optical fiber. This invention is based on Brillouin optical time-domain reflectometry (BOTDR) with stimulated Brillouin scattering (SBS). The method employs a short-time Fourier transform (STFT) to reconstruct the Brillouin frequency shift (BFS) of the SBS scattered signal, enabling precise dynamic strain measurement. He has 1 patent to his name.

Career Highlights

Yifei Yu is affiliated with the University of California, where he continues to advance research in fiber optics and related technologies. His work has garnered attention for its practical applications in various engineering fields.

Collaborations

Yifei Yu has collaborated with notable colleagues, including Kenichi Soga and Bo Li. Their joint efforts have contributed to the advancement of knowledge and technology in the field of fiber optics.

Conclusion

Yifei Yu's innovative contributions to fiber optics measurement demonstrate his expertise and commitment to advancing technology. His patented methods are paving the way for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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