The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Dec. 20, 2018
Applicant:
The Regents of the University of California, Oakland, CA (US);
Inventors:
Kenichi Soga, Berkeley, CA (US);
Bo Li, Harbin, CN;
Jize Yan, Cambridge, GB;
Linqing Luo, Hefei, CN;
Yifei Yu, Dalian, CN;
Assignee:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01K 11/32 (2006.01); G01L 1/24 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35364 (2013.01); G01D 5/35348 (2013.01); G01K 11/32 (2013.01); G01L 1/242 (2013.01); G01M 11/3118 (2013.01); G01K 2011/322 (2013.01);
Abstract
A system and method for distributed dynamic strain measurement using optical fiber that is based on Brillouin optical time-domain reflectometry (BOTDR) with stimulated Brillouin scattering (SBS). A short-time Fourier transform (STFT) is used to rebuild the Brillouin frequency shift (BFS) of the SBS scattered signal to perform the dynamic strain measurement.