Harbin, China

Bo Li

This inventor holds 2 USPTO granted patents. Top assignees: Institute of Food Processing, Haas, University of California. Active years: 2020-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bo Li. Retrieved from https://idiyas.com/inventor/bo-li-kc5dmt8i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020-2026

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2 patents (USPTO):Explore Patents

Title: Bo Li - Innovator in Optical Fiber Measurement Technology

Introduction

Bo Li is a prominent inventor based in Harbin, China. He has made significant contributions to the field of optical fiber measurement technology. His innovative work focuses on dynamic strain measurement using advanced optical techniques.

Latest Patents

Bo Li holds a patent for a system and method titled "Distributed dynamic strain fiber optics measurement by Brillouin optical time-domain reflectometry." This invention utilizes Brillouin optical time-domain reflectometry (BOTDR) combined with stimulated Brillouin scattering (SBS) to measure dynamic strain. The method employs a short-time Fourier transform (STFT) to accurately rebuild the Brillouin frequency shift (BFS) of the SBS scattered signal, enabling precise dynamic strain measurements.

Career Highlights

Bo Li is affiliated with the University of California, where he continues to advance research in optical fiber technologies. His work has garnered attention for its practical applications in various engineering fields.

Collaborations

He has collaborated with notable colleagues, including Kenichi Soga and Linqing Luo, to further enhance the impact of his research.

Conclusion

Bo Li's contributions to optical fiber measurement technology exemplify the innovative spirit of modern inventors. His work not only advances scientific understanding but also has practical implications in engineering and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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