Wuhan, China

Yicheng Feng

This inventor holds 2 USPTO granted patents. Top assignee: Wuhan Xinxin Semiconductor Manufacturing Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yicheng Feng. Retrieved from https://idiyas.com/inventor/yicheng-feng-ppl6e6h7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0


Company Filing History:


Years Active: 2026

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Yicheng Feng: Innovator in Semiconductor Technology

Introduction

Yicheng Feng is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a patent that addresses critical challenges in wafer processing.

Latest Patents

Yicheng Feng holds a patent for an "Overlay Mark, Overlay Error Measurement Method for Wafer, and Wafer Stacking Method." This invention is crucial for improving the accuracy and efficiency of semiconductor manufacturing processes. It showcases his expertise in addressing complex technical issues within the industry.

Career Highlights

Feng is currently employed at Wuhan Xinxin Semiconductor Manufacturing Co., Ltd. His role at the company allows him to apply his innovative ideas and contribute to advancements in semiconductor technology. With a focus on precision and quality, he plays a vital role in the development of cutting-edge solutions.

Collaborations

Yicheng Feng collaborates with talented individuals in his field, including coworkers Yuheng Huang and Bang Chen. Their combined expertise fosters a creative environment that drives innovation and enhances the company's capabilities.

Conclusion

Yicheng Feng is a dedicated inventor whose work in semiconductor technology has made a significant impact. His patent and contributions to Wuhan Xinxin Semiconductor Manufacturing Co., Ltd. highlight his commitment to advancing the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…