Company Filing History:
Years Active: 2023-2025
Title: Yi-Yen Lin: Innovator in Wafer Inspection Technology
Introduction
Yi-Yen Lin is a prominent inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of wafer inspection technology, holding 2 patents that enhance the accuracy and efficiency of semiconductor testing.
Latest Patents
One of his latest patents is a wafer inspection system that includes a carrier device, a probe card, a first metal kit, and a surround separating unit. This innovative system is designed to improve inspection accuracy by shielding the detection portion and wafer from external noise or interference sources. Another notable patent is a wafer inspection system and equipment that features a susceptor device, probe card, and bridge module. This design shortens the test loop path, enhancing the accuracy of signal transmission and inspection.
Career Highlights
Yi-Yen Lin is currently employed at Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work focuses on developing cutting-edge technologies that address the challenges in wafer inspection.
Collaborations
He collaborates with talented coworkers such as Wei-Chih Chen and Ben-Mou Yu, contributing to the innovative environment at Chroma Ate Inc.
Conclusion
Yi-Yen Lin's contributions to wafer inspection technology demonstrate his commitment to advancing the semiconductor industry. His patents reflect a deep understanding of the technical challenges and a drive to create effective solutions.