Taoyuan, Taiwan

Yi-Yen Lin

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Chroma Ate Inc.. Active years: 2023-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi-Yen Lin. Retrieved from https://idiyas.com/inventor/yi-yen-lin-wt3xlgil

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Yi-Yen Lin: Innovator in Wafer Inspection Technology

Introduction

Yi-Yen Lin is a prominent inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of wafer inspection technology, holding 2 patents that enhance the accuracy and efficiency of semiconductor testing.

Latest Patents

One of his latest patents is a wafer inspection system that includes a carrier device, a probe card, a first metal kit, and a surround separating unit. This innovative system is designed to improve inspection accuracy by shielding the detection portion and wafer from external noise or interference sources. Another notable patent is a wafer inspection system and equipment that features a susceptor device, probe card, and bridge module. This design shortens the test loop path, enhancing the accuracy of signal transmission and inspection.

Career Highlights

Yi-Yen Lin is currently employed at Chroma Ate Inc., a company known for its advanced testing and measurement solutions. His work focuses on developing cutting-edge technologies that address the challenges in wafer inspection.

Collaborations

He collaborates with talented coworkers such as Wei-Chih Chen and Ben-Mou Yu, contributing to the innovative environment at Chroma Ate Inc.

Conclusion

Yi-Yen Lin's contributions to wafer inspection technology demonstrate his commitment to advancing the semiconductor industry. His patents reflect a deep understanding of the technical challenges and a drive to create effective solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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