Company Filing History:
Years Active: 2020-2021
Title: Yi-Te Yeh: Innovator in Testing Methods and Systems
Introduction
Yi-Te Yeh is a prominent inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of testing methods and systems, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of testing circuitry, which is crucial in the semiconductor industry.
Latest Patents
Yi-Te Yeh's latest patents include innovative testing methods and systems. The first patent provides a testing method that involves converting circuit data from a scan test into a program. This program is designed to observe untested parts of circuitry that cannot be tested during the scan test. The method generates waveform data related to these untested parts and creates a look-up table based on the program and a netlist file, which indicates the circuitry. The testing is then performed according to the generated waveform data and look-up table.
The second patent also outlines a testing method performed by at least one processor. This method converts first data associated with a scan test into a program that observes untested parts of circuitry. It includes performing circuit simulations with the program based on a netlist file and testing patterns to rank these patterns. The method selects candidate testing patterns and conducts fault simulations on the circuitry to ensure thorough testing.
Career Highlights
Yi-Te Yeh is currently employed at Realtek Semiconductor Inc., a leading company in the semiconductor industry. His work at Realtek has allowed him to apply his innovative ideas in practical applications, contributing to the advancement of testing technologies.
Collaborations
Throughout his career, Yi-Te Yeh has collaborated with notable colleagues, including Chihtung Chen and Chia-Hsien Cheng. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in testing methods.
Conclusion
Yi-Te Yeh is a distinguished inventor whose work in testing methods and systems has made a significant impact in the semiconductor field. His innovative patents reflect his commitment to improving testing efficiency and accuracy. His contributions continue to shape the future of technology in this vital industry.