The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2021
Filed:
Jul. 29, 2019
Realtek Semiconductor Corporation, Hsinchu, TW;
Chihtung Chen, San Diego, CA (US);
Hsing-Han Tseng, Hsinchu, TW;
Yi-Te Yeh, Hsinchu County, TW;
Yung-Jen Chen, Zhubei, TW;
Te-Ming Kuo, Hsinchu, TW;
REALTEK SEMICONDUCTOR CORPORATION, Hsinchu, TW;
Abstract
The present disclosure provides a testing method and a testing system. The testing method is performed by at least one processor and includes the following operations: converting a circuit data of a scan test to a program, in which the program is configured to observe an untested part of a circuitry that is unable to be tested in the scan test; generating a waveform data associated with the untested part; generating a look-up table according to the program and a netlist file, in which the netlist file indicates the circuitry; and testing the untested part of the circuitry according to the waveform data and the look-up table.