Miaoli, Taiwan

Yi-Ping Peng

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi-Ping Peng. Retrieved from https://idiyas.com/inventor/yi-ping-peng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Yi-Ping Peng: Innovator in Semiconductor Technology

Introduction

Yi-Ping Peng is a notable inventor based in Miaoli, Taiwan. He has made significant contributions to the field of semiconductor technology. His innovative work focuses on the relationship between thermal and electrical properties of semiconductor devices.

Latest Patents

Yi-Ping Peng holds a patent for a "Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device." This method involves providing a semiconductor device, applying a detecting current, and heating the device. By measuring the temperatures and voltages, a relationship is established, allowing for the calculation of a temperature sensitive parameter (TSP). This invention enhances the understanding of semiconductor properties and their applications.

Career Highlights

Yi-Ping Peng is associated with the Industrial Technology Research Institute, where he continues to advance semiconductor research. His work has implications for improving device performance and reliability in various applications.

Collaborations

He has collaborated with notable colleagues, including Pei-Ting Chou and Chien-Ping Wang, contributing to a dynamic research environment.

Conclusion

Yi-Ping Peng's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the field. His work not only enhances our understanding of semiconductor properties but also paves the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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