Wuhan, China

Yi Lu

This inventor holds 1 USPTO granted patent. Top assignee: Wuhan Optics Valley Zoyon Science and Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi Lu. Retrieved from https://idiyas.com/inventor/yi-lu-xri2duma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yi Lu - Innovator in Precision Pavement Measurement

Introduction

Yi Lu is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of pavement measurement technology. His innovative approach has led to the development of a unique method for measuring pavement faults with precision.

Latest Patents

Yi Lu holds a patent for a "Precision three-dimensional pavement faulting measurement method and apparatus." This invention involves acquiring three-dimensional pavement contour data and utilizing it to obtain a contour reference surface. The method further includes identifying contour deviations and suspected joint points, leading to the generation of a target joint binary image. This process ultimately allows for the extraction of pavement faulting information, enhancing the accuracy of pavement assessments.

Career Highlights

Yi Lu is associated with Wuhan Optics Valley Zoyon Science and Technology Co., Ltd. His work at this company has been instrumental in advancing pavement measurement technologies. With a focus on precision and innovation, he has established himself as a key figure in this specialized field.

Collaborations

Yi Lu collaborates with talented individuals such as Hong Lin and Min Cao. Their combined expertise contributes to the success of their projects and the advancement of technology in pavement measurement.

Conclusion

Yi Lu's contributions to the field of pavement measurement through his innovative patent demonstrate his commitment to enhancing technology. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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