The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2026

Filed:

Apr. 07, 2022
Applicant:

Wuhan Optics Valley Zoyon Science and Technology Co., Ltd., Wuhan, CN;

Inventors:

Hong Lin, Wuhan, CN;

Min Cao, Wuhan, CN;

Yi Lu, Wuhan, CN;

Xinlin Wang, Wuhan, CN;

Xuan Qu, Wuhan, CN;

Hui Li, Wuhan, CN;

Xiuwen Hu, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 5/70 (2024.01); G06T 2207/10028 (2013.01); G06T 2207/30132 (2013.01);
Abstract

A precision three-dimensional pavement faulting measurement method includes: acquiring three-dimensional pavement contour data; based on the three-dimensional pavement contour data, obtaining a contour reference surface and a contour deviation between measuring points in the three-dimensional pavement contour data and the contour reference surface; based on the contour deviation, obtaining a suspected joint point; based on the suspected joint point, obtaining a suspected joint denoised binary image; based on a row direction projection feature of target measuring points in the suspected joint denoised binary image, obtaining an original joint target image and a joint representative position; based on the suspected joint denoised binary image, the original joint target image, and the joint representative position, obtaining a target joint binary image by means of a joint extension operation; and based on the target joint binary image and the three-dimensional pavement contour data, obtaining pavement faulting information.


Find Patent Forward Citations

Lin, Hong. (2026). Precision three-dimensional pavement faulting measurement method and apparatus (U.S. Patent No. 12725243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12725243

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