Wuhan, China

Xiuwen Hu

This inventor holds 1 USPTO granted patent. Top assignee: Wuhan Optics Valley Zoyon Science and Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiuwen Hu. Retrieved from https://idiyas.com/inventor/xiuwen-hu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiuwen Hu and Precision Pavement Faulting Measurement

Introduction

Xiuwen Hu is an inventor based in Wuhan, China. His work includes a patented method and apparatus for measuring pavement faulting using three-dimensional pavement data. He is associated with Wuhan Optics Valley Zoyon Science and Technology Co., Ltd.

Latest Patents

Hu is credited with 1 patent: “Precision Three-Dimensional Pavement Faulting Measurement Method and Apparatus.” The invention processes three-dimensional pavement contour data to establish a reference surface and identify deviations between measured points and that surface. It uses those deviations to locate suspected pavement joints, denoise and analyze image data, and extend the identified joint region. The resulting target joint image is combined with the contour data to determine pavement faulting information.

Career Highlights

The patent describes a measurement approach that integrates three-dimensional surface data with image-processing operations. By identifying joint locations and relating them to pavement contours, the method is designed to support precise assessment of pavement faulting.

Collaborations

Hu is associated with Wuhan Optics Valley Zoyon Science and Technology Co., Ltd. His listed coworkers include Min Cao and Yi Lu.

Conclusion

Xiuwen Hu’s patent focuses on combining three-dimensional pavement measurements and joint-image processing to obtain pavement faulting information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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