Company Filing History:
Years Active: 2016
Title: Yi Liu - Innovator in Defect Detection Methods
Introduction
Yi Liu is a prominent inventor based in Milpitas, CA (US). He has made significant contributions to the field of defect detection methods, showcasing his expertise through his innovative patent.
Latest Patents
Yi Liu holds a patent titled "Selecting parameters for defect detection methods." This patent involves computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for a defect detection method. The method includes selecting parameters using an optimization function and information for a set of classified defects, which encompasses defects of interest and nuisance defects. The goal is to ensure that the selected parameters meet the objectives of the defect detection method. He has 1 patent to his name.
Career Highlights
Yi Liu is currently employed at Kla Tencor Corporation, where he applies his knowledge and skills to advance technology in defect detection. His work has been instrumental in improving the efficiency and accuracy of defect detection processes.
Collaborations
Some of his notable coworkers include Kenong Wu and Chris W Lee, who contribute to the innovative environment at Kla Tencor Corporation.
Conclusion
Yi Liu's contributions to defect detection methods highlight his role as an influential inventor in the technology sector. His innovative approach continues to shape advancements in this critical field.