Taipei, Taiwan

Yi-Hung Kuo

This inventor holds 1 USPTO granted patent. Top assignee: National Taiwan University. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yi-Hung Kuo. Retrieved from https://idiyas.com/inventor/yi-hung-kuo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Yi-Hung Kuo: Innovator in Electron Beam Technology

Introduction

Yi-Hung Kuo is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of electron beam technology, particularly through his innovative patent that addresses electron beam drift detection.

Latest Patents

Yi-Hung Kuo holds a patent for an "Electron beam drift detection device and method for detecting electron beam drift." This invention involves a method that includes placing a predetermined characteristic identification pattern on a surface of a workpiece. The process entails emitting an electron beam, focusing and deflecting it to scan the surface of the workpiece and the characteristic identification pattern. The invention detects backscattered electrons and secondary electrons, receiving detection signals to perform image processing. This allows for the measurement of drift degree by comparing the electronic image with the predetermined shape of the characteristic identification pattern. He has 1 patent to his name.

Career Highlights

Yi-Hung Kuo is affiliated with National Taiwan University, where he continues to advance research in electron beam technologies. His work has implications for various applications in materials science and engineering.

Collaborations

He collaborates with notable colleagues, including Yung-yaw Chen and Cheng-Ju Wu, contributing to a dynamic research environment.

Conclusion

Yi-Hung Kuo's innovative work in electron beam drift detection showcases his expertise and commitment to advancing technology in this specialized field. His contributions are valuable to both academic and practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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