Yi-Heng Chou

Title: Yi-Heng Chou: Innovator in Depth Measurement and 3D Space Annotation

Introduction

Yi-Heng Chou is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the fields of depth measurement and three-dimensional space annotation. With a total of 2 patents, his work showcases innovative methods and systems that enhance technological capabilities.

Latest Patents

One of Yi-Heng Chou's latest patents is titled "Method and system for remote sharing three-dimensional space annotation trajectory." This invention provides a method and system for sharing annotation trajectories in a three-dimensional space. The system involves a first electronic apparatus that detects a three-dimensional movement trajectory of a target object and sends relevant information to a second electronic apparatus for reconstruction and presentation in a different space.

Another significant patent is the "Apparatus and method for dual mode depth measurement." This invention allows for measuring depth information of both specular and textured surfaces using different modes. The apparatus includes various components such as a light source, controller, and imaging optical system, enabling it to switch between depth from defocus and depth from focus modes.

Career Highlights

Yi-Heng Chou is affiliated with the Industrial Technology Research Institute, where he continues to develop innovative solutions in his field. His work has garnered attention for its practical applications and technological advancements.

Collaborations

He has collaborated with notable colleagues, including Ludovic Angot and Kun-Lung Tseng, contributing to a dynamic research environment that fosters innovation.

Conclusion

Yi-Heng Chou's contributions to depth measurement and three-dimensional space annotation reflect his commitment to advancing technology. His patents demonstrate a blend of creativity and technical expertise that continues to influence the industry.