Company Filing History:
Years Active: 2009
Title: Yi-Ching Chen: Innovator in Thickness Measurement Technology
Introduction
Yi-Ching Chen is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of thickness measurement technology. His innovative approach has led to the development of a unique system and method that enhances measurement accuracy.
Latest Patents
Yi-Ching Chen holds a patent for a "System and method for thickness measurement." This invention involves a sophisticated setup that includes two confocal microscopes. The system emits light beams in opposing directions and focuses them at distinct focal planes. By adjusting the relative positions of the microscopes, the invention allows for precise thickness measurements.
Career Highlights
Yi-Ching Chen is affiliated with the Industrial Technology Research Institute, where he continues to advance his research and development efforts. His work is characterized by a commitment to innovation and excellence in measurement technologies.
Collaborations
Some of his notable coworkers include Kai-Yu Cheng and Yen-Liang Chen. Their collaborative efforts contribute to the success of projects at the Industrial Technology Research Institute.
Conclusion
Yi-Ching Chen's contributions to thickness measurement technology exemplify the spirit of innovation. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving measurement techniques.