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For the Inventor, By the Inventor

Saratoga, CA, United States of America

Yeng-Kaung Peng

This inventor holds 6 USPTO granted patents. Top assignee: Advanced Micro Devices Corporation. Active years: 1996-2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yeng-Kaung Peng. Retrieved from https://idiyas.com/inventor/yeng-kaung-peng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6

% Patents Active = 100.0

Average Co-Inventor Count = 3.6

ph-index = 6

Forward Citations = 186(Granted Patents)


Location History:

  • Saratoga, CA (US) (1996 - 1998)
  • Los Altos, CA (US) (1999 - 2000)

Company Filing History:

goldMedal6 out of 13,168 
 
Advanced Micro Devices Corporation
 patents

Years Active: 1996-2000

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6 patents (USPTO):Explore Patents
1. 6028994 - Method for predicting performance of microelectronic device based on (2000-02-22),
2. 5886909 - Defect diagnosis using simulation for IC yield improvement (1999-03-23),
3. 5822717 - Method and apparatus for automated wafer level testing and reliability (1998-10-13),
4. 5787190 - Method and apparatus for pattern recognition of wafer test bins (1998-07-28),
5. 5598341 - Real-time in-line defect disposition and yield forecasting system (1997-01-28),
6. 5561293 - Method of failure analysis with CAD layout navigation and FIB/SEM (1996-10-01),

Title: Yeng-Kaung Peng: Innovator in Microelectronics

Introduction

Yeng-Kaung Peng is a prominent inventor based in Saratoga, California. He has made significant contributions to the field of microelectronics, holding a total of 6 patents. His work focuses on improving the performance and yield of microelectronic devices through innovative methodologies.

Latest Patents

One of his latest patents is a method for predicting the performance of microelectronic devices based on electrical parameter testing. This method involves performing tests on multiple devices to obtain parametric and performance values. These values are then used as inputs to a computer program, such as a back propagation neural network engine, which generates a performance prediction model. This model can predict the performance of devices being fabricated and can be configured to provide insights into defect types and performance ranges.

Another notable patent addresses defect diagnosis using simulation for integrated circuit yield improvement. This patent highlights the challenges in diagnosing defects in integrated circuit wafers, as inspections can only occur after certain processing steps. By utilizing defect simulation, Yeng-Kaung Peng's work helps to understand the relationship between defects and wafer profiles, ultimately aiding in yield improvement efforts.

Career Highlights

Yeng-Kaung Peng is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His innovative approaches have contributed to advancements in microelectronic device fabrication and performance prediction.

Collaborations

He has collaborated with notable coworkers, including Siu-May Ho and Ying Shiau, to further enhance the research and development efforts in their field.

Conclusion

Yeng-Kaung Peng's contributions to microelectronics through his patents and innovative methodologies have significantly impacted the industry. His work continues to pave the way for advancements in device performance and yield improvement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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