The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1998
Filed:
Jul. 31, 1995
Applicant:
Inventors:
Jerry Tsiang, Cupertino, CA (US);
Mikkel Lantz, Santa Clara, CA (US);
Yeng-Kaung Peng, Saratoga, CA (US);
Ying Shiau, San Jose, CA (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
702108 ; 438 17 ; 324765 ; 324719 ; 702 57 ;
Abstract
Methods and apparatus are disclosed for testing integrated circuits at the wafer level and for integrating test results, calculation of lifetimes and generation of trend charts in a common database following testing. A wafer tester controller is supplemented with additional hardware and software to avoid data transfer errors and facilitate processing and storage of test results. The data base is available over a network to all areas of an organization.