Tainan, Taiwan

Yen-Ying Lin

This inventor holds 1 USPTO granted patent. Top assignee: National Yang Ming Chiao Tung University. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yen-Ying Lin. Retrieved from https://idiyas.com/inventor/yen-ying-lin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Yen-Ying Lin: Innovator in Semiconductor Technology

Introduction

Yen-Ying Lin is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative methods for parameter extraction in semiconductor devices.

Latest Patents

Yen-Ying Lin holds a patent titled "Method for parameter extraction of a semiconductor device." This method involves measuring gate-to-source and gate-to-drain capacitances and performing 3D simulations to compute fringing capacitances. The process allows for the computation of overlap capacitance between the gate and a source/drain extension region, as well as determining the length of the source/drain extension region based on the overlap capacitance. He has 1 patent to his name.

Career Highlights

Yen-Ying Lin is affiliated with National Yang Ming Chiao Tung University, where he continues to advance research in semiconductor technologies. His work has been instrumental in enhancing the understanding and efficiency of semiconductor devices.

Collaborations

Yen-Ying Lin collaborates with Jyh-Chyurn Guo, who is also involved in semiconductor research. Their partnership contributes to the development of innovative solutions in the field.

Conclusion

Yen-Ying Lin's contributions to semiconductor technology through his patented methods highlight his role as an influential inventor. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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