Company Filing History:
Years Active: 2025
Title: Yehonatan Ridelman: Innovator in Semiconductor Defect Examination
Introduction
Yehonatan Ridelman is a notable inventor based in Gan-Yavne, Israel. He has made significant contributions to the field of semiconductor technology, particularly in defect examination. His innovative approach utilizes machine learning to enhance the accuracy and efficiency of defect detection in semiconductor specimens.
Latest Patents
Yehonatan Ridelman holds a patent for a system and method for defect examination on a semiconductor specimen. This patent outlines a method that involves obtaining a runtime image of the semiconductor specimen and generating a reference image using a machine learning model. The process includes performing defect examination on the runtime image by comparing it with the generated reference image. The machine learning model is trained using a set of images that include both defective and defect-free examples, allowing for optimized defect detection.
Career Highlights
Yehonatan Ridelman is currently employed at Applied Materials Israel Limited, where he continues to work on advancing semiconductor technologies. His expertise in machine learning applications in defect examination has positioned him as a valuable asset in the industry.
Collaborations
Yehonatan collaborates with talented colleagues, including Yehonatan Hai Ofir and Ran Badanes, contributing to innovative projects within the company.
Conclusion
Yehonatan Ridelman's work in semiconductor defect examination showcases his commitment to innovation and technology. His contributions are paving the way for advancements in the semiconductor industry, enhancing the reliability and performance of electronic devices.