This inventor holds 1 USPTO granted patent. Top assignee: Buhler (India) Pvt. Ltd.. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Ye Aung - Innovator in Grain Measurement Technology.
Introduction
Ye Aung is a notable inventor based in Yangon, Myanmar. She has made significant contributions to the field of agricultural technology, particularly in the measurement of grain smoothness. Her innovative approach has the potential to enhance the quality assessment processes in grain production.
Latest Patents
Ye Aung holds a patent for a method and an arrangement for measuring the smoothness of grains. This invention relates to a system that includes a channel for supplying grains, especially rice grains. An obstacle is strategically placed within the channel to slow down the grains as they fall, allowing them to form a heap on the obstacle. An image capturing device is positioned to capture an image of this heap. The area under the curve of the captured image indicates the degree of smoothness of the grains, providing a reliable measurement method.
Career Highlights
Ye Aung is currently employed at Buhler (India) Pvt. Ltd., where she continues to develop her innovative ideas. Her work focuses on improving grain quality assessment techniques, which are crucial for the agricultural industry. With her expertise, she aims to contribute to advancements in food technology.
Collaborations
Some of her coworkers include Jyoti Prakash Mishra and Gopalakrishnan Trikkur. Their collaboration fosters a creative environment that encourages innovation and the development of new technologies in grain measurement.
Conclusion
Ye Aung's contributions to the field of grain measurement technology exemplify her dedication to innovation. Her patent for measuring grain smoothness showcases her ability to address practical challenges in agriculture. Through her work, she is making a significant impact on the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile