The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 06, 2018
Filed:
Feb. 24, 2014
Buhler (India) Pvt. Ltd., Attibele, IN;
Jyoti Prakash Mishra, Attibele, IN;
Manit Kumar, Attibele, IN;
Gopalakrishnan Trikkur, Attibele, IN;
Bismillah Kani, Attibele, IN;
Ye Aung, Yangon, MM;
Buhler (India) Pvt., Ltd., Attibele, Bangalore District, IN;
Abstract
The present invention relates to a method and an arrangement for measuring the smoothness of grains. In one embodiment, the arrangement includes a channel for supplying grains, especially rice grains, an obstacle arranged at the channel to slow down grains falling on the obstacle, so that the flow of grains forms a heap on the obstacle and an image capturing device placed facing the obstacle. The image capturing device is arranged to capture an image of the heap, where the area under the curve of the captured heap image indicates the degree of smoothness of the grains or the course of the curve of the captured heap image indicates the degree of smoothness of the grains.