Peoria, AZ, United States of America

Yavuz Selim Saglam

This inventor holds 1 USPTO granted patent. Top assignee: Keithley Instruments, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yavuz Selim Saglam. Retrieved from https://idiyas.com/inventor/yavuz-selim-saglam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yavuz Selim Saglam: Inventor of a Dual-Band Instrument Communication System.

Introduction

Yavuz Selim Saglam is an inventor associated with Peoria, Arizona, and Keithley Instruments, Inc. His listed patent focuses on improving communication between test and measurement instruments through a combination of high bandwidth and low latency.

Latest Patents

Saglam is credited with 1 patent: “Dual-band instrument communication to achieve high bandwidth and low latency.” The invention describes a system in which two test and measurement instruments communicate over a dual-band link. A high-bandwidth connection transfers test data, while an independent low-latency connection carries control commands. Because the control link has lower latency, the design aims to support responsive instrument operation without sacrificing the capacity needed to transfer test data.

Career Highlights

Saglam’s listed work is connected to Keithley Instruments, Inc., a company associated with test and measurement technology. His patent addresses a practical challenge in instrument systems: handling data transfer and control communications with different performance requirements.

Collaborations

The provided information lists Michael D. Rayman and Dawson C. Green as Saglam’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Yavuz Selim Saglam’s listed invention combines separate high-bandwidth and low-latency communication paths to support efficient data transfer and responsive control between test and measurement instruments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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