This inventor holds 1 USPTO granted patent. Top assignee: Jeol Ltd.. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Innovations of Yasushi Hiroki in Charged Particle Beam Instruments
Introduction
Yasushi Hiroki is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam instruments. His innovative work has led to the development of a unique instrument that enhances in situ observation capabilities in gaseous atmospheres.
Latest Patents
Hiroki holds a patent for a charged particle beam instrument. This instrument is designed to perform observations of specimens placed in a gaseous atmosphere. It features a specimen chamber, a gas supply portion for introducing gas into the chamber, and a venting portion for releasing gas. Additionally, it includes a gaseous environment adjuster and a gas controller that regulates the gaseous environment. The gas controller sets a target pressure value based on a predetermined relationship between the readings of a vacuum gauge and the pressure inside the specimen chamber. This innovative design allows for precise control of the gas inflow rate, ensuring optimal observation conditions.
Career Highlights
Hiroki is currently employed at Jeol Ltd., a company renowned for its advanced scientific instruments. His work at Jeol Ltd. has allowed him to further develop his expertise in charged particle beam technology. He has dedicated his career to enhancing the capabilities of scientific instruments, making significant strides in the field.
Collaborations
Hiroki collaborates with Mitsuaki Ohsaki, a fellow innovator in the field. Their partnership has fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Yasushi Hiroki's contributions to the field of charged particle beam instruments exemplify the spirit of innovation. His patented technology not only advances scientific observation but also showcases the potential for future developments in this area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
