Company Filing History:
Years Active: 1999-2003
Title: Yasuo Miwa: Innovator in Automatic Inspection Technology
Introduction
Yasuo Miwa is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of automatic inspection technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and accuracy of defect detection in various products.
Latest Patents
One of Yasuo Miwa's latest patents is an "Automatic Inspecting Apparatus by Image Processing." This innovative apparatus is designed to generate a discharge signal for defective objects at a predetermined position. It includes an imaging device that captures images of moving objects, a sensor for detecting the arrival of these objects, and an image processing unit that analyzes the images to identify defects. The system generates a discharge signal when a defective object is detected, ensuring that it is removed from the production line efficiently.
Another significant patent is the "Method for Detecting Defect in Bottle." This method focuses on identifying defects in the barrel portion of bottles, such as thin blisters and longitudinal streaks. By utilizing a CCD camera and a light shield plate with oblique slits, the method captures images of the bottle barrel and processes them to determine the presence of defects.
Career Highlights
Yasuo Miwa is currently employed at Kirin Techno-System Corporation, where he continues to develop innovative solutions in the field of automatic inspection. His expertise in image processing and defect detection has positioned him as a valuable asset to the company.
Collaborations
Yasuo has collaborated with several talented individuals, including Tohru Ishikura and Hiroyuki Fukuchi. Their combined efforts have contributed to advancements in inspection technology and have fostered a collaborative environment for innovation.
Conclusion
Yasuo Miwa's contributions to automatic inspection technology demonstrate his commitment to innovation and quality assurance. His patents reflect a deep understanding of image processing and defect detection, making him a key figure in his field.