The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2003

Filed:

Jun. 01, 2000
Applicant:
Inventors:

Tohru Ishikura, Yokohama, JP;

Hiroyuki Fukuchi, Yokohama, JP;

Yasuo Miwa, Yokohama, JP;

Takanori Hatsuki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

An automatic inspecting apparatus has a function for generating a discharge signal for discharging a defective object at a predetermined position. The automatic inspecting apparatus comprises an imaging device for imaging a moving object, a sensor for detecting the arrival of the object, an image processing unit for processing images produced by the imaging device to detect defective objects, and a discharge signal generating unit for discharging defective objects at a predetermined position. An ID number is assigned to each image produced by the imaging device, and pulses generated by an encoder start to be counted when each ID number is assigned. If the object is determined to be defective after image processing by the image processing unit, the discharge signal generating unit generates a discharge signal when the number of pulses counted for the corresponding ID number reaches a pulse number equivalent to the distance between the sensor position and the discharge position.


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