The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2001

Filed:

Nov. 30, 1999
Applicant:
Inventors:

Tohru Ishikura, Yokohama, JP;

Hiroyuki Fukuchi, Yokohama, JP;

Yasuo Miwa, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ;
U.S. Cl.
CPC ...
G01N 2/100 ;
Abstract

The present invention relates to a method for detecting a defect in a barrel portion of a bottle. The defect in the barrel portion of the bottle includes a thin blister and a longitudinal streak. The defect in the bottle barrel is detected by imaging the bottle barrel with a CCD camera based on light which has passed through a light shield plate having a plurality of oblique slits and the bottle barrel, and processing the image of the bottle barrel generated by the CCD camera to determine whether or not the defect is present.


Find Patent Forward Citations

Loading…